During in-circuit testing (ICT), each component of an electronic assembly is checked for faults. Short circuits, interruptions, soldering or component faults are detected and assemblies are rejected according to a go/no-go test.

During functional testing (FCT), the assemblies are tested completely or in partial areas for the intended operation. The function test of the modules is carried out in the end application or in an environment that simulates the end application.

Depending on the test item, the application and the operation conditions, Columbia provides the optimal solution:

• International standard contact probes
• Metric contact probes
• Progressive Series for difficult conditions
• Flying probes
• Bead probes
• Bare board probes
• Fine pitch probes

For more info about this or related products, don’t hesitate to Contact us!